Microbeam Analysis Society of America. National Conference, Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel, Donald R. Beaman. Wiley.
Chicago Style (17th ed.) CitationMicrobeam Analysis Society of America. National Conference, Benjamin Morton Siegel, and Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis / Edited by Benjamin M. Siegel, Donald R. Beaman. New York ; London (etc.): Wiley, 1975.
MLA (9th ed.) CitationMicrobeam Analysis Society of America. National Conference, et al. Physical Aspects of Electron Microscopy and Microbeam Analysis / Edited by Benjamin M. Siegel, Donald R. Beaman. Wiley, 1975.
Warning: These citations may not always be 100% accurate.