Attribute sampling plans, tables of tests, and confidence limits for proportions / Robert E. Odeh, D.B. Owen.

Saved in:
Bibliographic Details
Main Author: Odeh, Robert E
Other Authors: Owen, D. B. (Donald B.)
Format: Book
Language:English
Published: New York : M. Dekker, c1983
Series:Statistics : textbooks and monographs ; vol.49
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!