Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez.

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Bibliographic Details
Main Author: Pineda de Gyvez, José
Format: Book
Language:English
Published: Boston ; London : Kluwer Academic, c1993.
Series:The Kluwer international series in engineering and computer science. Microelectronics manufacturing 208
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing
Integrated circuits > Very large scale integration > Defects > Mathematical models
Computer-aided design
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