Electronic packaging reliability : presented at the 1993 ASME Winter Annual Meeting, New Orleans, Louisiana, November 28-December 3, 1993 / sponsored by the Electrical and Electronic Packaging Division, ASME ; edited by Luu T. Nguyen, Michael G. Pecht.

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Bibliographic Details
Corporate Authors: Pecht. Electrical and Electronic Packaging Division, American Society of Mechanical Engineers. Winter Meeting
Other Authors: Nguyen, Luu T., Pecht, Michael
Format: Book
Language:English
Published: New York, NY : American Society of Mechanical Engineers, 1993
Series:EEP (Series) ; v.6
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