Optical inspection and testing : proceedings of a conference held 17-18 November 1992, Boston, Massachusetts / sponsored by SPIE--The International Society for Optical Engineering ; James D. Trolinger, editor.
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| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE Optical Engineering Press,
c1993
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| Series: | Critical reviews of optical science and technology ;
v.CR46 |
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