Loading…

Chip scale package (CSP) : design, materials, processes, reliability, and applications / John Lau, Shi-Wei Ricky Lee. design, materials, processes, reliability, and applications /

Saved in:
Bibliographic Details
Main Author: Lau, John H.
Other Authors: Lee, Shi-Wei Ricky
Format: Book
Language:English
Published: London : McGraw-Hill, 1999
Series:Electronic packaging and interconnection
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!

Pilkington Library

Availability details from Pilkington Library
Shelfmark: 621.381046/LAU
Copy number Shelving location Availability
Copy [0402039009] Unknown On Shelf