Semiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim.

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Bibliographic Details
Main Author: Chim, Wai Kin
Format: Book
Language:English
Published: Chichester, [England] ; New York : Wiley, 2000.
Subjects:
Semiconductors > Failures
Semiconductors > Testing
Semiconductors > Microscopy
Photon emission
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