APA (7th ed.) Citation

Chim, W. K. (2000). Semiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim: Using photon emission microscopy. Wiley.

Chicago Style (17th ed.) Citation

Chim, Wai Kin. Semiconductor Device and Failue Analysis : Using Photon Emission Microscopy / Wai Kin Chim: Using Photon Emission Microscopy. Chichester, [England] ; New York: Wiley, 2000.

MLA (9th ed.) Citation

Chim, Wai Kin. Semiconductor Device and Failue Analysis : Using Photon Emission Microscopy / Wai Kin Chim: Using Photon Emission Microscopy. Wiley, 2000.

Warning: These citations may not always be 100% accurate.