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Design for at-speed test, diagnosis and measurement / edited by Benoit Nadeau-Dostie.

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Bibliographic Details
Other Authors: Nadeau-Dostie, Benoit
Format: Book
Language:English
Published: Boston, Mass. ; London : Kluwer Academic, c2000.
Series:Frontiers in electronic testing
Subjects:
Integrated circuits > Testing
Electronic apparatus and appliances > Testing
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