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High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut and Lynwood Swanson. FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology /

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Bibliographic Details
Main Author: Orloff, Jon
Other Authors: Utlaut, Mark William, 1949-, Swanson, Lynwood, 1934-
Format: Book
Language:English
Published: New York ; London : Kluwer Academic/Plenum, 2002.
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Pilkington Library

Availability details from Pilkington Library
Shelfmark: 530.41/ORL
Copy number Shelving location Availability
Copy [0402684176] Unknown On Shelf