Orloff, J., Utlaut, M. W., & Swanson, L. (2002). High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut and Lynwood Swanson: FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology. Kluwer Academic/Plenum.
Chicago Style (17th ed.) CitationOrloff, Jon, Mark William Utlaut, and Lynwood Swanson. High Resolution Focused Ion Beams : FIB and Its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology / Jon Orloff, Mark Utlaut and Lynwood Swanson: FIB and Its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. New York ; London: Kluwer Academic/Plenum, 2002.
MLA (9th ed.) CitationOrloff, Jon, et al. High Resolution Focused Ion Beams : FIB and Its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology / Jon Orloff, Mark Utlaut and Lynwood Swanson: FIB and Its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. Kluwer Academic/Plenum, 2002.