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Applied logistic regression /...
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Applied logistic regression / David W. Hosmer and Stanley Lemeshow.
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Bibliographic Details
Main Author:
Hosmer, David W.
Other Authors:
Lemeshow, Stanley
Format:
Book
Language:
English
Published:
New York ; Chichester :
Wiley,
2000.
Edition:
2nd ed.
Subjects:
Regression analysis
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