Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA / Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Saved in:
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
c2003.
|
| Series: | SPIE proceedings series ;
v. 5011 |
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|