Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
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| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. : Springfield, Va. :
SPIE ; IS&T,
c2006.
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| Series: | SPIE proceedings series,
v. 6070 |
| Subjects: | |
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