Microstructural characterization of materials / David Brandon and Wayne Kaplan.
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Hoboken, N.J. :
Wiley,
2008.
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| Edition: | 2nd ed. |
| Series: | Quantitative software engineering series
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| Subjects: | |
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