Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland.

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Bibliographic Details
Main Author: Goodhew, Peter J. (Peter John), 1943-
Other Authors: Beanland, R., Humphreys, F. J. (F John)
Format: eBook
Language:English
Published: London : Taylor & Francis, 2001.
Edition:3rd ed.
Subjects:
Online Access:https://www.vlebooks.com/vleweb/product/openreader?id=LBORO&isbn=9780203184257
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