34th Applied Imagery and Pattern Recognition Workshop [multi-modal imaging] : proceedings : October 19-21, 2005, Washington, D.C. / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; presented by AIPR ; edited by Robert J. Bonneau.
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| Corporate Authors: | , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Los Alamitos, Calif. :
IEEE Computer Society,
c2006.
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| Subjects: | |
| Online Access: | Restricted to IEEE Xplore subscribers |
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