Library Catalogue Plus

APA (7th ed.) Citation

AIPR Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Xplore (Online service), & Bonneau, R. J. (2006). 34th Applied Imagery and Pattern Recognition Workshop [multi-modal imaging] : proceedings : October 19-21, 2005, Washington, D.C. / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; presented by AIPR ; edited by Robert J. Bonneau: [multi-modal imaging] : proceedings : October 19-21, 2005, Washington, D.C. IEEE Computer Society.

Chicago Style (17th ed.) Citation

AIPR Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Xplore (Online service), and Robert J. Bonneau. 34th Applied Imagery and Pattern Recognition Workshop [multi-modal Imaging] : Proceedings : October 19-21, 2005, Washington, D.C. / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; Presented by AIPR ; Edited by Robert J. Bonneau: [multi-modal Imaging] : Proceedings : October 19-21, 2005, Washington, D.C. Los Alamitos, Calif.: IEEE Computer Society, 2006.

MLA (9th ed.) Citation

AIPR Workshop Washington, D.C., et al. 34th Applied Imagery and Pattern Recognition Workshop [multi-modal Imaging] : Proceedings : October 19-21, 2005, Washington, D.C. / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; Presented by AIPR ; Edited by Robert J. Bonneau: [multi-modal Imaging] : Proceedings : October 19-21, 2005, Washington, D.C. IEEE Computer Society, 2006.