The18th International Conference on Pattern Recognition proceedings : 20 - 24 August, 2006, Hong Kong / [editors, Y.Y Tang ... [et al.].
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| Corporate Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Los Alamitos, Calif. :
IEEE Computer Society Press,
2006.
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| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=11159 |
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