Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology.
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| Corporate Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, N.J. :
IEEE,
c2006.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=10819 |
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