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Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology. SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium Dallas, Tex., Components, Packaging & Manufacturing Technology Society, National Institute of Standards and Technology (U.S.), IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Piscataway, N.J. : IEEE, c2006.
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Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=10819
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