Library Catalogue Plus

APA (7th ed.) Citation

IEEE Semiconductor Thermal Measurement and Management Symposium Dallas, Tex., Components, Packaging & Manufacturing Technology Society, National Institute of Standards and Technology (U.S.), & IEEE Xplore (Online service). (2006). Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology: SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006. IEEE.

Chicago Style (17th ed.) Citation

IEEE Semiconductor Thermal Measurement and Management Symposium Dallas, Tex., Packaging & Manufacturing Technology Society Components, National Institute of Standards and Technology (U.S.), and IEEE Xplore (Online service). Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology: SEMI-THERM Proceedings 2006 : Dallas, TX, USA, March 14-16, 2006. Piscataway, N.J.: IEEE, 2006.

MLA (9th ed.) Citation

IEEE Semiconductor Thermal Measurement and Management Symposium Dallas, Tex., et al. Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology: SEMI-THERM Proceedings 2006 : Dallas, TX, USA, March 14-16, 2006. IEEE, 2006.