Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague.

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Bibliographic Details
Corporate Authors: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic, IEEE Computer Society. Technical Council on Test Technology, Ceske vysoke uceni technicke v Praze, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, 2006.
Subjects:
Integrated circuits > Testing > Congresses.
Integrated circuits > Design > Congresses.
Microelectronics > Design > Congresses.
Microelectronics > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=10974
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