IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic, IEEE Computer Society. Technical Council on Test Technology, Ceske vysoke uceni technicke v Praze, & IEEE Xplore (Online service). (2006). Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague: April 18-21, 2006, Prague, Czech Republic. IEEE Computer Society.
Chicago Style (17th ed.) CitationIEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic, IEEE Computer Society. Technical Council on Test Technology, Ceske vysoke uceni technicke v Praze, and IEEE Xplore (Online service). Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / Sponsored by IEEE Computer Society Test Technology Technical Council ; in Cooperation with Czech Technical University in Prague: April 18-21, 2006, Prague, Czech Republic. Los Alamitos, Calif.: IEEE Computer Society, 2006.
MLA (9th ed.) CitationIEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic, et al. Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / Sponsored by IEEE Computer Society Test Technology Technical Council ; in Cooperation with Czech Technical University in Prague: April 18-21, 2006, Prague, Czech Republic. IEEE Computer Society, 2006.