2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan ; in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society.
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| Corporate Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Los Alamitos, Calif. :
IEEE Computer Society,
c2006.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=11003 |
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