2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology DTIS 2006 : proceedings : September 05-07, 2006, Tunis, Tunisia / [edited by Patrick Girard ... [et al.].
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| Corporate Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, N.J. :
Institute of Electrical and Electronics Engineers,
c2006.
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| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=11202 |
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