International Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis, Tunisia, IEEE Xplore (Online service), & Girard, P. (2006). 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology DTIS 2006 : proceedings : September 05-07, 2006, Tunis, Tunisia / [edited by Patrick Girard ... [et al.]: DTIS 2006 : proceedings : September 05-07, 2006, Tunis, Tunisia. Institute of Electrical and Electronics Engineers.
Chicago Style (17th ed.) CitationInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis, Tunisia, IEEE Xplore (Online service), and Patrick Girard. 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology DTIS 2006 : Proceedings : September 05-07, 2006, Tunis, Tunisia / [edited by Patrick Girard ... [et Al.]: DTIS 2006 : Proceedings : September 05-07, 2006, Tunis, Tunisia. Piscataway, N.J.: Institute of Electrical and Electronics Engineers, 2006.
MLA (9th ed.) CitationInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis, Tunisia, et al. 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology DTIS 2006 : Proceedings : September 05-07, 2006, Tunis, Tunisia / [edited by Patrick Girard ... [et Al.]: DTIS 2006 : Proceedings : September 05-07, 2006, Tunis, Tunisia. Institute of Electrical and Electronics Engineers, 2006.