The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing].

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Va., IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society. Technical Council on Test Technology, IEEE Xplore (Online service)
Other Authors: Park, Nohpill
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2006.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4030903
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