Library Catalogue Plus

APA (7th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Va., IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society. Technical Council on Test Technology, IEEE Xplore (Online service), & Park, N. (2006). The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]: Proceedings : Arlington, Virginia, USA, October 4-6, 2006. IEEE Computer Society.

Chicago Style (17th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Va., IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society. Technical Council on Test Technology, IEEE Xplore (Online service), and Nohpill Park. The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et Al.] ; Sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]: Proceedings : Arlington, Virginia, USA, October 4-6, 2006. Los Alamitos, Calif.: IEEE Computer Society, 2006.

MLA (9th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Va., et al. The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et Al.] ; Sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]: Proceedings : Arlington, Virginia, USA, October 4-6, 2006. IEEE Computer Society, 2006.