Proceedings, 34th Applied Imagery Pattern Recognition Workshop October 19-21, 2005, Washington, DC / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; presented by AIPR ; edited by Robert J. Bonneau.
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| Corporate Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
[Piscataway, N.J.] :
IEEE,
c2006.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=10735 |
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