Library Catalogue Plus

APA (7th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, & Bonneau, R. J. (2006). Proceedings, 34th Applied Imagery Pattern Recognition Workshop October 19-21, 2005, Washington, DC / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; presented by AIPR ; edited by Robert J. Bonneau: October 19-21, 2005, Washington, DC. IEEE.

Chicago Style (17th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, and Robert J. Bonneau. Proceedings, 34th Applied Imagery Pattern Recognition Workshop October 19-21, 2005, Washington, DC / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; Presented by AIPR ; Edited by Robert J. Bonneau: October 19-21, 2005, Washington, DC. [Piscataway, N.J.]: IEEE, 2006.

MLA (9th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., et al. Proceedings, 34th Applied Imagery Pattern Recognition Workshop October 19-21, 2005, Washington, DC / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; Presented by AIPR ; Edited by Robert J. Bonneau: October 19-21, 2005, Washington, DC. IEEE, 2006.