VAST, IEEE Symposium Visual Analytics Science and Technology, 2006 proceedings, Baltimore, Maryland, USA, October 31-November 2, 2006 / edited by Pak Chung Wong, Daniel Keim ; [sponsored by IEEE Society Visualization and Graphics Technical Committee (VGTC) ; in cooperation with ACM SIGGRAPH].

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Bibliographic Details
Corporate Authors: IEEE Symposium on Visual Analytics Science and Technology Baltimore, Md., IEEE Xplore (Online service), IEEE Computer Society. Technical Committee on Visualization and Graphics, SIGGRAPH
Other Authors: Wong, Pak Chung, Keim, Daniel
Format: eBook
Language:English
Published: Piscataway, NJ : IEEE, c2006.
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Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4035729
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