Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang].

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Bibliographic Details
Corporate Authors: International Workshop on Microprocessor Test and Verification Austin, Tex., IEEE Computer Society. Technical Council on Test Technology, IEEE Xplore (Online service), Institute of Electrical and Electronics Engineers
Other Authors: Abadir, M., Wang, Li-C., 1963-
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE, c2006.
Subjects:
Microprocessors > Testing > Congresses.
Integrated circuits > Testing > Congresses.
Integrated circuits > Verification > Congresses.
Systems on a chip > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4022212
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