Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
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| Corporate Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, N.J. :
IEEE,
2006.
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| Subjects: | |
| Online Access: | Connect to this title online; UW restricted |
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