International Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore, IEEE Reliability/CPMT/ED Singapore Chapter, IEEE Electron Devices Society, IEEE Xplore (Online service), & Gan, C. L. (2006). Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore: IPFA 2006. IEEE.
Chicago Style (17th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore, IEEE Reliability/CPMT/ED Singapore Chapter, IEEE Electron Devices Society, IEEE Xplore (Online service), and Chee Lip Gan. Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / Edited by Gan Chee Lip ... [et Al.] ; Organised by IEEE Reliability/CPMT/ED Singapore Chapter ; Technically Co-sponsored by IEEE Electron Devices Society ... [et Al.] ; in Co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore: IPFA 2006. Piscataway, N.J.: IEEE, 2006.
MLA (9th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore, et al. Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / Edited by Gan Chee Lip ... [et Al.] ; Organised by IEEE Reliability/CPMT/ED Singapore Chapter ; Technically Co-sponsored by IEEE Electron Devices Society ... [et Al.] ; in Co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore: IPFA 2006. IEEE, 2006.