35th Applied Imagery and Pattern Recognition Workshop AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.

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Bibliographic Details
Corporate Authors: Applied Imagery Pattern Recognition Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2006.
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Online Access:Restricted to IEEE Xplore subscribers
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