Library Catalogue Plus

APA (7th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, & IEEE Xplore (Online service). (2006). 35th Applied Imagery and Pattern Recognition Workshop AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence: AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA. IEEE Computer Society.

Chicago Style (17th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, and IEEE Xplore (Online service). 35th Applied Imagery and Pattern Recognition Workshop AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence: AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA. Los Alamitos, Calif.: IEEE Computer Society, 2006.

MLA (9th ed.) Citation

Applied Imagery Pattern Recognition Workshop Washington, D.C., et al. 35th Applied Imagery and Pattern Recognition Workshop AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA / Sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence: AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA. IEEE Computer Society, 2006.