2007 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) proceedings of technical papers : April 25-27, 2007, Ambassador Hotel, Hsinchu, Taiwan / Industrial Technology Research Institute, IEEE.

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Bibliographic Details
Corporate Authors: International Symposium on VLSI Design, Automation, and Test Hsin-chu shih, Taiwan, Gong ye ji shu yan jiu yuan, Institute of Electrical and Electronics Engineers
Format: eBook
Language:English
Published: Piscataway, NJ : IEEE, c2007.
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Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4239382
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