Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 11-13, 2007, Krakow, Poland / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].

Saved in:
Bibliographic Details
Corporate Authors: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Krakow, Poland, IEEE Computer Society. Technical Council on Test Technology, Politechnika Slaska im. W. Pstrowskiego
Other Authors: Girard, Patrick, Ph. D.
Format: eBook
Language:English
Published: Piscataway, N.J. : IEEE, c2007.
Subjects:
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4295238
Tags: Add Tag
No Tags, Be the first to tag this record!