DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy / edited by Cristiana Bolchini ... [et al.] ; IEEE Computer Society.

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Rome, Italy, IEEE Computer Society
Other Authors: Bolchini, Cristiana
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, c2007.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4358358
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