IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Rome, Italy, IEEE Computer Society, & Bolchini, C. (2007). DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy / edited by Cristiana Bolchini ... [et al.] ; IEEE Computer Society: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy. IEEE Computer Society Press.
Chicago Style (17th ed.) CitationIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Rome, Italy, IEEE Computer Society, and Cristiana Bolchini. DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : Proceedings : 26-28 September, 2007, Rome, Italy / Edited by Cristiana Bolchini ... [et Al.] ; IEEE Computer Society: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : Proceedings : 26-28 September, 2007, Rome, Italy. Los Alamitos, Calif.: IEEE Computer Society Press, 2007.
MLA (9th ed.) CitationIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Rome, Italy, et al. DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : Proceedings : 26-28 September, 2007, Rome, Italy / Edited by Cristiana Bolchini ... [et Al.] ; IEEE Computer Society: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : Proceedings : 26-28 September, 2007, Rome, Italy. IEEE Computer Society Press, 2007.