VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 proceedings, Sacramento, California, USA, October 30-November 1, 2007 / edited by William Ribarsky, John Dill ; sponsored by IEEE Computer Society Visualization and Graphics Technical Committee [in cooperation with ACM SIGGRAPH].
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| Corporate Authors: | , , |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
[Piscataway, N.J.] :
IEEE Xplore,
c2007.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4388976 |
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