Library Catalogue Plus

APA (7th ed.) Citation

IEEE Symposium on Visual Analytics Science and Technology Sacramento, Calif, IEEE Computer Society. Technical Committee on Visualization and Graphics, SIGGRAPH, Ribarsky, W., & Keim, D. (2007). VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 proceedings, Sacramento, California, USA, October 30-November 1, 2007 / edited by William Ribarsky, John Dill ; sponsored by IEEE Computer Society Visualization and Graphics Technical Committee [in cooperation with ACM SIGGRAPH]: Proceedings, Sacramento, California, USA, October 30-November 1, 2007. IEEE Xplore.

Chicago Style (17th ed.) Citation

IEEE Symposium on Visual Analytics Science and Technology Sacramento, Calif, IEEE Computer Society. Technical Committee on Visualization and Graphics, SIGGRAPH, William Ribarsky, and Daniel Keim. VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 Proceedings, Sacramento, California, USA, October 30-November 1, 2007 / Edited by William Ribarsky, John Dill ; Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee [in Cooperation with ACM SIGGRAPH]: Proceedings, Sacramento, California, USA, October 30-November 1, 2007. [Piscataway, N.J.]: IEEE Xplore, 2007.

MLA (9th ed.) Citation

IEEE Symposium on Visual Analytics Science and Technology Sacramento, Calif, et al. VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 Proceedings, Sacramento, California, USA, October 30-November 1, 2007 / Edited by William Ribarsky, John Dill ; Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee [in Cooperation with ACM SIGGRAPH]: Proceedings, Sacramento, California, USA, October 30-November 1, 2007. IEEE Xplore, 2007.