Fourth IEEE International Workshop on Electronic Design, Test and Applications editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, UK, National Instruments ; in cooperation with Chinese University of Hong Kong.

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Electronic Design, Test and Applications Hong Kong, China, IEEE Computer Society. Technical Council on Test Technology, National Instruments (Firm), IEEE Hong Kong Section Electron Devices Society, Hong Kong University of Science and Technology, Chinese University of Hong Kong
Other Authors: Osseiran, Adam
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2008.
Subjects:
Electronics > Research > Congresses.
Electronics > Design > Congresses.
Electronics > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4459488
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