APA (7th ed.) Citation

IEEE International Workshop on Electronic Design, Test and Applications Hong Kong, China, IEEE Computer Society. Technical Council on Test Technology, National Instruments (Firm), IEEE Hong Kong Section Electron Devices Society, Hong Kong University of Science and Technology, Chinese University of Hong Kong, & Osseiran, A. (2008). Fourth IEEE International Workshop on Electronic Design, Test and Applications editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, UK, National Instruments ; in cooperation with Chinese University of Hong Kong. IEEE Computer Society.

Chicago Style (17th ed.) Citation

IEEE International Workshop on Electronic Design, Test and Applications Hong Kong, China, IEEE Computer Society. Technical Council on Test Technology, National Instruments (Firm), IEEE Hong Kong Section Electron Devices Society, Hong Kong University of Science and Technology, Chinese University of Hong Kong, and Adam Osseiran. Fourth IEEE International Workshop on Electronic Design, Test and Applications Editors, Adam Osseiran ... [et Al.] ; Sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with Industrial Co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, UK, National Instruments ; in Cooperation with Chinese University of Hong Kong. Los Alamitos, Calif.: IEEE Computer Society, 2008.

MLA (9th ed.) Citation

IEEE International Workshop on Electronic Design, Test and Applications Hong Kong, China, et al. Fourth IEEE International Workshop on Electronic Design, Test and Applications Editors, Adam Osseiran ... [et Al.] ; Sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with Industrial Co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, UK, National Instruments ; in Cooperation with Chinese University of Hong Kong. IEEE Computer Society, 2008.

Warning: These citations may not always be 100% accurate.