Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology.
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| Corporate Authors: | , , |
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| Format: | eBook |
| Language: | English |
| Published: |
[Piscataway, N.J.] :
IEEE,
2007.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4160867 |
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