IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif, Components, Packaging & Manufacturing Technology Society, & National Institute of Standards and Technology (U.S.). (2007). Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology: SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007. IEEE.
Chicago Style (17th ed.) CitationIEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif, Packaging & Manufacturing Technology Society Components, and National Institute of Standards and Technology (U.S.). Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology: SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007. [Piscataway, N.J.]: IEEE, 2007.
MLA (9th ed.) CitationIEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif, et al. Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology: SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007. IEEE, 2007.