2007 IEEE International High Level Design Validation and Test Workshop proceedings : November 7-9, 2007, Irvine, California / sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee.

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Bibliographic Details
Corporate Authors: IEEE International High-Level Design Validation and Test Workshop Irvine, Calif., IEEE Computer Society. Technical Council on Test Technology, IEEE Computer Society. Design Automation Technical Committee
Format: eBook
Language:English
Published: Piscataway, NJ : IEEE, c2007.
Subjects:
Microprocessors > Testing > Congresses.
Computer software > Verification > Congresses.
Electronic circuits > Testing > Congresses.
Electronic digital computers > Evaluation > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4392771
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