Wavelet Analysis and Pattern Recognition, 2007. ICWAPR '07. International Conference on date: 2-4 Nov. 2007.

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Bibliographic Details
Corporate Authors: International Conference on Wavelet Analysis and Pattern Recognition Beijing, China, IEEE Solid-State Circuits Society
Format: eBook
Language:English
Published: [Piscataway, N.J. : IEEE, 2007].
Subjects:
Wavelets (Mathematics) > Congresses.
Wavelengths > Data processing > Congresses.
Pattern perception > Congresses.
Imaging systems > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4420623
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