International Test Conference 2007 proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.

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Bibliographic Details
Corporate Authors: International Test Conference Santa Clara, Calif., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Washington, D.C. : International Test Conference, c2007.
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Nanotechnology > Congresses.
Radio frequency > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4437545
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