International Test Conference Santa Clara, Calif, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section, & IEEE Xplore (Online service). (2007). International Test Conference 2007 proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section: Proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA. International Test Conference.
Chicago Style (17th ed.) CitationInternational Test Conference Santa Clara, Calif, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section, and IEEE Xplore (Online service). International Test Conference 2007 Proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA / Sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section: Proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA. Washington, D.C.: International Test Conference, 2007.
MLA (9th ed.) CitationInternational Test Conference Santa Clara, Calif, et al. International Test Conference 2007 Proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA / Sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section: Proceedings : October 23-October 25, 2007, Santa Clara Convention Center, Santa Clara, California, USA. International Test Conference, 2007.